Equipment database

Search by location
tool/instrument
or process

• Search database •

NanolabNL

Tool specifications

Database
  • AFM-STM
  • MESA+ NanoLab Twente
  • Inspection / Metrology
  • AFM
  • Own design
  • Surface inspection
  • Analyzing surface topography by atomic force microscopy
  • Small samples up to 100 mm


banner apply for free use of facilities