Equipment database

Search by location
or process

• Search database •


Tool specifications

  • 4 point measurement probe own design
  • MESA+ NanoLab Twente
  • Characterisation
  • 4-point probing
  • Own design
  • Resistivity measurement
  • Determination of the sheet resistively of a conducting thin film by a four-point measurement
  • Measurement range from 1 mOhm square upward
  • Up to 100 mm

banner apply for free use of facilities