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NanolabNL

Tool specifications

Database
  • AFM
  • Veeco Dimension 3000 AFM
  • AMOLF NanoLab Amsterdam
  • Inspection / Metrology
  • AFM
  • Veeco
  • Surface inspection
  • Analyzing surface topography by atomic force microscopy
  • Contact and tapping mode AFM, liquid cell, STM, C-AFM
  • up to wafer 100 mm


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