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NanolabNL
Tool specifications
Database
id
date
2011-08-25
Tool name
4 point measurement probe own design
Apparatus
Location
MESA+ NanoLab Twente
Process
Characterisation
Sub-process
4-point probing
Supplier
Own design
Website supplier
http://www.utwente.nl/mesaplus/
Function
Resistivity measurement
Main purpose
Determination of the sheet resistively of a conducting thin film by a four-point measurement
Main characteristics
Measurement range from 1 mOhm square upward
(Extra) facilities
Specimen
Up to 100 mm
Contactform
Contact
MESA+ NanoLab Twente